Electron Microscopy and Diffraction Studies of Vanadium Pentoxide Sols

Vanadium Pentoxide and Other Inorganic Vanadium Compounds

VANADIUM PENTOXIDE 1. Exposure Data

The nomenclature of selected vanadium compounds is given in Table 1. Chem. Abstr. Serv. Reg. No.: 1314-62-1 Deleted CAS Reg. No.: 12503-98-9; 56870-07-6; 87854-55-5; 87854-56-6; 16616537-3; 172928-47-1; 184892-22-6; 200577-85-1; 203812-34-4; 251927-12-5; 41054690-6 Chem. Abstr. Serv. Name: Vanadium oxide (V2O5) IUPAC Systematic Name: Vanadium oxide Synonyms: CI 77938; divanadium pentaoxide; pen...

Cation-Induced Coiling of Vanadium Pentoxide Nanobelts

Single-crystalline V(2)O(5)·xH(2)O nanorings and microloops were chemically assembled via an ion-induced chemical spinning route in the designed hydrothermal system. The morphology and structure of products were investigated by means of scanning electron microscopy (SEM) and transmission electron microscopy (TEM). X-ray powder diffraction (XRD) measurement, energy-dispersive X-ray spectroscopy ...

Electron Diffraction Using Transmission Electron Microscopy

Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (≈2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter (≈1...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...